The GX5295 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture – making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
At the moment this is a product without any direct competition!

Features:

• 32 input / output channels, dynamically configurable on a per channel basis
• 4 control / timing channels with programmable levels
• 256 MB of on-board vector memory
• High performance pin electronics with per channel programmability
• Per channel parametric measurement unit (PMU)
• Drive / sense voltage range of -2 V to + 7 V
• 100 MHz vector rate
• Stimulus / Response & Real-time Compare modes
• Operates as a stand-alone card or with up to seven additional synchronous slave boards

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